卓上型X線回折装置の性能に影響を与える要因

卓上型XRDの性能は、装置の分解能（FWHM）に依存します。<0.04°2θ), goniometer linearity (±0.02°2θ), and low-angle ability. Sample form, size, and quantity matter. Voltage, current, scan speed/range, and method are key settings. Cooling, lab environment, and maintenance ensure stability and accuracy.

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